{"id":124,"date":"2017-08-18T18:12:47","date_gmt":"2017-08-18T18:12:47","guid":{"rendered":"https:\/\/www.i-test.ca\/?page_id=124\/"},"modified":"2017-08-23T20:40:47","modified_gmt":"2017-08-23T20:40:47","slug":"solutions-in-circuit-test","status":"publish","type":"page","link":"https:\/\/www.i-test.ca\/fr\/solutions-in-circuit-test\/","title":{"rendered":"In-Circuit Test (ICT) 3070"},"content":{"rendered":"

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M\u00e9thode de test consistant \u00e0 utiliser des probes pour v\u00e9rifier la qualit\u00e9 d’un circuit imprim\u00e9. Elle est la technologie la plus compl\u00e8te des m\u00e9thodes de test pr\u00e9fonctionnel.<\/h3>\n

Elle couvre les domaines suivants :<\/strong><\/span><\/h3>\n
    \n
  • \u00a0\u00a0\u00a0\u00a0\u00a0\u00a0Courts-circuits & circuit ouvert<\/li>\n
  • \u00a0\u00a0\u00a0\u00a0\u00a0\u00a0Composantes analogues passives & actives<\/li>\n
  • \u00a0\u00a0\u00a0\u00a0\u00a0\u00a0Composantes Bscan & digitales<\/li>\n
  • \u00a0\u00a0\u00a0\u00a0\u00a0\u00a0Test de continuit\u00e9<\/li>\n
  • \u00a0\u00a0\u00a0\u00a0\u00a0\u00a0Composantes programmables (CPLD, FPGA, FLASH, Serial PROM, \u00b5CPU)<\/li>\n
  • \u00a0\u00a0\u00a0\u00a0\u00a0\u00a0Tests fonctionnels Boot-up\/RAMTest\/BISTest<\/li>\n
  • \u00a0\u00a0\u00a0\u00a0\u00a0\u00a0Tests de LED automatiques<\/li>\n<\/ul>\n

    <\/h3>\n

    Station de test :\u00a0Keysight (Agilent) HP3070<\/strong><\/span><\/h3>\n

     <\/p>\n

     <\/p>\n

    [\/vc_column_text][\/vc_column][\/vc_row][vc_row full_width=\u00a0\u00bbstretch_row_content\u00a0\u00bb parallax=\u00a0\u00bbcontent-moving\u00a0\u00bb parallax_image=\u00a0\u00bb65″][vc_column]

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    [vc_row][vc_column][vc_column_text] M\u00e9thode de test consistant \u00e0 utiliser des probes pour v\u00e9rifier la qualit\u00e9 d’un circuit imprim\u00e9. Elle est la technologie la plus compl\u00e8te des m\u00e9thodes de test pr\u00e9fonctionnel. Elle couvre les domaines suivants : \u00a0\u00a0\u00a0\u00a0\u00a0\u00a0Courts-circuits & circuit ouvert \u00a0\u00a0\u00a0\u00a0\u00a0\u00a0Composantes analogues passives & actives \u00a0\u00a0\u00a0\u00a0\u00a0\u00a0Composantes Bscan & digitales \u00a0\u00a0\u00a0\u00a0\u00a0\u00a0Test de continuit\u00e9 \u00a0\u00a0\u00a0\u00a0\u00a0\u00a0Composantes programmables (CPLD, FPGA, FLASH,…<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":2,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-124","page","type-page","status-publish","hentry","description-off"],"yoast_head":"\nIn-Circuit Test (ICT) 3070 - i-test | Standard and customized pre-functional test solutions<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.i-test.ca\/circuit-test-services\/\" \/>\n<meta property=\"og:locale\" content=\"fr_FR\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"In-Circuit Test (ICT) 3070 - i-test | Standard and customized pre-functional test solutions\" \/>\n<meta property=\"og:description\" content=\"[vc_row][vc_column][vc_column_text] M\u00e9thode de test consistant \u00e0 utiliser des probes pour v\u00e9rifier la qualit\u00e9 d’un circuit imprim\u00e9. 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