{"id":141,"date":"2017-08-18T18:40:37","date_gmt":"2017-08-18T18:40:37","guid":{"rendered":"https:\/\/www.i-test.ca\/?page_id=141\/"},"modified":"2017-08-23T20:42:43","modified_gmt":"2017-08-23T20:42:43","slug":"test-boundary-scan-bst","status":"publish","type":"page","link":"https:\/\/www.i-test.ca\/fr\/test-boundary-scan-bst\/","title":{"rendered":"Test Boundary-Scan (BST)"},"content":{"rendered":"

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M\u00e9thode de test consistant \u00e0 utiliser le port JTAG pour v\u00e9rifier la qualit\u00e9 ou programmer des composantes Boundary-Scan popul\u00e9es sur un circuit imprim\u00e9.<\/h3>\n

Elle couvre les domaines suivants\u00a0:<\/span><\/h3>\n
    \n
  • Test de connexion & d’interconnexion<\/li>\n
  • Test de clusters<\/li>\n
  • Test de m\u00e9moires (DRAM, SDRAM, SRAM)<\/li>\n
  • Composantes programmables (CPLD, FPGA, FLASH, Serial PROM)<\/li>\n<\/ul>\n

    Station de test :\u00a0<\/span>JTAG Technologies<\/h3>\n

     <\/p>\n

    \"itest-JTAG-Boundary-Scan-BST\"<\/p>\n

     <\/p>\n

    [\/vc_column_text][\/vc_column][\/vc_row][vc_row full_width=\u00a0\u00bbstretch_row_content\u00a0\u00bb content_placement=\u00a0\u00bbbottom\u00a0\u00bb parallax=\u00a0\u00bbcontent-moving\u00a0\u00bb parallax_image=\u00a0\u00bb64″][vc_column]

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    [vc_row][vc_column][vc_column_text] M\u00e9thode de test consistant \u00e0 utiliser le port JTAG pour v\u00e9rifier la qualit\u00e9 ou programmer des composantes Boundary-Scan popul\u00e9es sur un circuit imprim\u00e9. Elle couvre les domaines suivants\u00a0: Test de connexion & d’interconnexion Test de clusters Test de m\u00e9moires (DRAM, SDRAM, SRAM) Composantes programmables (CPLD, FPGA, FLASH, Serial PROM) Station de test :\u00a0JTAG Technologies…<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":3,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-141","page","type-page","status-publish","hentry","description-off"],"yoast_head":"\nTest Boundary-Scan (BST) - i-test | Standard and customized pre-functional test solutions<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.i-test.ca\/boundary-scan-test\/\" \/>\n<meta property=\"og:locale\" content=\"fr_FR\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Test Boundary-Scan (BST) - i-test | Standard and customized pre-functional test solutions\" \/>\n<meta property=\"og:description\" content=\"[vc_row][vc_column][vc_column_text] M\u00e9thode de test consistant \u00e0 utiliser le port JTAG pour v\u00e9rifier la qualit\u00e9 ou programmer des composantes Boundary-Scan popul\u00e9es sur un circuit imprim\u00e9. 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