{"id":154,"date":"2017-08-18T18:54:55","date_gmt":"2017-08-18T18:54:55","guid":{"rendered":"https:\/\/www.i-test.ca\/?page_id=154\/"},"modified":"2017-08-23T20:48:15","modified_gmt":"2017-08-23T20:48:15","slug":"analyse-de-testabilite-dft","status":"publish","type":"page","link":"https:\/\/www.i-test.ca\/fr\/analyse-de-testabilite-dft\/","title":{"rendered":"Analyse de testabilit\u00e9 (DFT)"},"content":{"rendered":"

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Ensemble de proc\u00e9dures \u00e9lectriques et m\u00e9caniques permettant la v\u00e9rification de la testabilit\u00e9 d’un circuit imprim\u00e9 pour les technologies X-Ray, ICT & JTAG.<\/h3>\n

Avantages :<\/strong><\/span><\/h3>\n
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  • Augmentation de la couverture de test<\/li>\n
  • D\u00e9tection de la couverture de test avant la fabrication des PCBs<\/li>\n
  • Am\u00e9lioration des processus de design des PCBs<\/li>\n<\/ul>\n

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    [vc_row][vc_column][vc_column_text] Ensemble de proc\u00e9dures \u00e9lectriques et m\u00e9caniques permettant la v\u00e9rification de la testabilit\u00e9 d’un circuit imprim\u00e9 pour les technologies X-Ray, ICT & JTAG. Avantages : Augmentation de la couverture de test D\u00e9tection de la couverture de test avant la fabrication des PCBs Am\u00e9lioration des processus de design des PCBs         [\/vc_column_text][\/vc_column][\/vc_row][vc_row full_width=\u00a0\u00bbstretch_row_content\u00a0\u00bb…<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":4,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-154","page","type-page","status-publish","hentry","description-off"],"yoast_head":"\nAnalyse de testabilit\u00e9 (DFT) - i-test | Standard and customized pre-functional test solutions<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.i-test.ca\/design-testability-dft-analysis\/\" \/>\n<meta property=\"og:locale\" content=\"fr_FR\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Analyse de testabilit\u00e9 (DFT) - i-test | Standard and customized pre-functional test solutions\" \/>\n<meta property=\"og:description\" content=\"[vc_row][vc_column][vc_column_text] Ensemble de proc\u00e9dures \u00e9lectriques et m\u00e9caniques permettant la v\u00e9rification de la testabilit\u00e9 d’un circuit imprim\u00e9 pour les technologies X-Ray, ICT & JTAG. Avantages : Augmentation de la couverture de test D\u00e9tection de la couverture de test avant la fabrication des PCBs Am\u00e9lioration des processus de design des PCBs         [\/vc_column_text][\/vc_column][\/vc_row][vc_row full_width=\u00a0\u00bbstretch_row_content\u00a0\u00bb…\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.i-test.ca\/design-testability-dft-analysis\/\" \/>\n<meta property=\"og:site_name\" content=\"i-test | Standard and customized pre-functional test solutions\" \/>\n<meta property=\"article:modified_time\" content=\"2017-08-23T20:48:15+00:00\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Dur\u00e9e de lecture estim\u00e9e\" \/>\n\t<meta name=\"twitter:data1\" content=\"1 minute\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.i-test.ca\\\/design-testability-dft-analysis\\\/\",\"url\":\"https:\\\/\\\/www.i-test.ca\\\/design-testability-dft-analysis\\\/\",\"name\":\"Analyse de testabilit\u00e9 (DFT) - i-test | Standard and customized pre-functional test solutions\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.i-test.ca\\\/#website\"},\"datePublished\":\"2017-08-18T18:54:55+00:00\",\"dateModified\":\"2017-08-23T20:48:15+00:00\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.i-test.ca\\\/design-testability-dft-analysis\\\/#breadcrumb\"},\"inLanguage\":\"fr-FR\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.i-test.ca\\\/design-testability-dft-analysis\\\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.i-test.ca\\\/design-testability-dft-analysis\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/www.i-test.ca\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Analyse de testabilit\u00e9 (DFT)\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.i-test.ca\\\/#website\",\"url\":\"https:\\\/\\\/www.i-test.ca\\\/\",\"name\":\"i-test | Standard and customized pre-functional test solutions\",\"description\":\"\",\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.i-test.ca\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"fr-FR\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Analyse de testabilit\u00e9 (DFT) - i-test | Standard and customized pre-functional test solutions","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.i-test.ca\/design-testability-dft-analysis\/","og_locale":"fr_FR","og_type":"article","og_title":"Analyse de testabilit\u00e9 (DFT) - i-test | Standard and customized pre-functional test solutions","og_description":"[vc_row][vc_column][vc_column_text] Ensemble de proc\u00e9dures \u00e9lectriques et m\u00e9caniques permettant la v\u00e9rification de la testabilit\u00e9 d’un circuit imprim\u00e9 pour les technologies X-Ray, ICT & JTAG. 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