Test method that uses probes to verify the quality of a printed circuit. ICT is the most complete technology of all the pre-functional test methods.

It covers the following domains:

  • Short circuits & open circuits
  • Passive & active analog components
  • Bscan & digital components
  • Continuity test
  • Programmable components (CPLD, FPGA, FLASH, Serial PROM, µCPU)
  • Boot-up/RAMTest/BISTest functional tests
  • Automated LED tests

Test Station: Keysight (Agilent) HP3070